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Comparison of contr...
Comparison of contrast-to-noise ratios of different detection methods in ultrasound optical tomography
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- Bengtsson, Alexander (author)
- Lund University,Lunds universitet,NanoLund: Centre for Nanoscience,Annan verksamhet, LTH,Lunds Tekniska Högskola,Atomfysik,Fysiska institutionen,Institutioner vid LTH,LTH profilområde: Nanovetenskap och halvledarteknologi,LTH profilområden,Other operations, LTH,Faculty of Engineering, LTH,Atomic Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH,LTH Profile Area: Nanoscience and Semiconductor Technology,LTH Profile areas,Faculty of Engineering, LTH
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- Hill, David (author)
- Lund University,Lunds universitet,NanoLund: Centre for Nanoscience,Annan verksamhet, LTH,Lunds Tekniska Högskola,Atomfysik,Fysiska institutionen,Institutioner vid LTH,LTH profilområde: Nanovetenskap och halvledarteknologi,LTH profilområden,LTH profilområde: Teknik för hälsa,Other operations, LTH,Faculty of Engineering, LTH,Atomic Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH,LTH Profile Area: Nanoscience and Semiconductor Technology,LTH Profile areas,Faculty of Engineering, LTH,LTH Profile Area: Engineering Health,Faculty of Engineering, LTH,SpectraCure AB
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- Shortiss, Kevin (author)
- Lund University,Lunds universitet,NanoLund: Centre for Nanoscience,Annan verksamhet, LTH,Lunds Tekniska Högskola,Atomfysik,Fysiska institutionen,Institutioner vid LTH,Other operations, LTH,Faculty of Engineering, LTH,Atomic Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH
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- Rippe, Lars (author)
- Lund University,Lunds universitet,NanoLund: Centre for Nanoscience,Annan verksamhet, LTH,Lunds Tekniska Högskola,Atomfysik,Fysiska institutionen,Institutioner vid LTH,LTH profilområde: Nanovetenskap och halvledarteknologi,LTH profilområden,LTH profilområde: Avancerade ljuskällor,LTH profilområde: Teknik för hälsa,Other operations, LTH,Faculty of Engineering, LTH,Atomic Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH,LTH Profile Area: Nanoscience and Semiconductor Technology,LTH Profile areas,Faculty of Engineering, LTH,LTH Profile Area: Photon Science and Technology,Faculty of Engineering, LTH,LTH Profile Area: Engineering Health,Faculty of Engineering, LTH
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- Kröll, Stefan (author)
- Lund University,Lunds universitet,NanoLund: Centre for Nanoscience,Annan verksamhet, LTH,Lunds Tekniska Högskola,Atomfysik,Fysiska institutionen,Institutioner vid LTH,LTH profilområde: Nanovetenskap och halvledarteknologi,LTH profilområden,LTH profilområde: Avancerade ljuskällor,LTH profilområde: Teknik för hälsa,Other operations, LTH,Faculty of Engineering, LTH,Atomic Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH,LTH Profile Area: Nanoscience and Semiconductor Technology,LTH Profile areas,Faculty of Engineering, LTH,LTH Profile Area: Photon Science and Technology,Faculty of Engineering, LTH,LTH Profile Area: Engineering Health,Faculty of Engineering, LTH
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(creator_code:org_t)
- 2022
- 2022
- English 17 s.
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In: Biomedical Optics Express. - 2156-7085. ; 13:9, s. 4834-4850
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https://doi.org/10.1...
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Abstract
Subject headings
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- Ultrasound optical tomography (UOT) is a hybrid imaging modality based on interaction between ultrasound and light, with a potential to extend optical imaging capabilities in biological tissues to depths of several centimeters. Several methods have been developed to detect the UOT signal. To better understand their potential for deep tissue imaging, we present a theoretical contrast-to-noise comparison between the spectral hole burning, single-shot off-axis holography, speckle contrast, and photorefractive detection methods for UOT. Our results indicate that spectral hole burning filters have the potential to reach the largest imaging depths. We find that digital off-axis holography and photorefractive detection can have good contrast-to-noise ratio at significant depths. The speckle contrast method has a smaller penetration depth comparatively.
Subject headings
- NATURVETENSKAP -- Fysik -- Atom- och molekylfysik och optik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Atom and Molecular Physics and Optics (hsv//eng)
Publication and Content Type
- art (subject category)
- ref (subject category)
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