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Accurate Condition Monitoring of Semiconductor Devices in Cascaded H-Bridge Modular Multilevel Converters

Asoodar, Mohsen (författare)
KTH,Elkraftteknik
Nahalparvari, Mehrdad (författare)
KTH,Elkraftteknik
Zhang, Yi (författare)
Aalborg Univ, DK-9220 Aalborg, Denmark.
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Danielsson, Christer (författare)
Hitachi Energy, Västerås, Sweden.
Nee, Hans-Peter, 1963- (författare)
KTH,Elkraftteknik
Blaabjerg, Frede (författare)
Aalborg Univ, DK-9220 Aalborg, Denmark.
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 (creator_code:org_t)
Institute of Electrical and Electronics Engineers (IEEE), 2023
2023
Engelska.
Ingår i: IEEE transactions on power electronics. - : Institute of Electrical and Electronics Engineers (IEEE). - 0885-8993 .- 1941-0107. ; 38:3, s. 3870-3884
  • Tidskriftsartikel (refereegranskat)
Abstract Ämnesord
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  • This article presents an online condition monitoring (CM) scheme for semiconductors used in modular multilevel converters (MMCs) that comprise cascaded H-bridge submodules. The CM algorithm is based on detecting changes in the ON-state resistance of the semiconductors over time. The proposed method is shown to successfully perform a curve tracing of semiconductors in MMCs while the semiconductor junction remains at a temperature that is readily measurable and undergoes minute changes during the measurement process. The ON-state resistance value is estimated from the measured ON-state voltage drop of the semiconductors and the measured arm current. Measuring the ON-state resistance at known temperatures allows for separating temperature-dependent variations of the ON-state resistance from age-dependent variations of this parameter. Suitable methods for reducing the effect of noise on the curve-traced data are proposed, and a recursive least square estimator is used to extract the optimum ON-state resistance from the traced v(CE) - i

Ämnesord

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Nyckelord

Temperature measurement
Semiconductor device measurement
Electrical resistance measurement
Automatic voltage control
Resistance
Monitoring
Voltage measurement
Cascaded H-bridge
condition monitoring (CM)
flexible ac transmission systems (FACTS)
health estimation
modular multilevel converter (MMC)
online monitoring
reliability
semiconductors

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