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LIBRIS Formathandbok  (Information om MARC21)
FältnamnIndikatorerMetadata
00003439naa a2200397 4500
001oai:DiVA.org:liu-50103
003SwePub
008091011s2006 | |||||||||||000 ||eng|
024a https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-501032 URI
024a https://doi.org/10.1016/j.tsf.2005.12.2692 DOI
040 a (SwePub)liu
041 a engb eng
042 9 SwePub
072 7a ref2 swepub-contenttype
072 7a art2 swepub-publicationtype
100a Khranovskyy, V.u Institute for Problems of Material Science, Krzhyzhanovskyy str. 3, 03142 Kiev, Ukraine, University of Oslo, Physics Department, Centre for Materials Science and Nanotechnology, N-0316 Oslo, Norway4 aut
2451 0a Structural and morphological properties of ZnO :b Ga thin films
264 1b Elsevier BV,c 2006
338 a print2 rdacarrier
520 a Zinc oxide (ZnO) is a promising semiconductor material with a great variety of applications. Compared to undoped ZnO, impurity-doped ZnO has a lower resistivity and better stability. With this aim, Ga has been proposed as a dopant. In this study, the structural characteristics and surface morphology of ZnO films produced by PEMOCVD at a substrate temperature of 250 °C on the c-plane (001) of sapphire were investigated. Doping was realized with 1, 3, 5 and 10 wt.% of Ga2(AA)3 in the precursor's mixture. At lower contents, Ga stimulates growth of (002) oriented textured films and the smallest FWHM was obtained as low as 0.17° for ZnO:Ga with 1 wt.%. A change in preferential orientation as well as surface smoothing and roughness decreasing of the films were observed with further increasing Ga content in precursor's mixture. We assume a key role of Ga and note that such a feature would be beneficial for the application of ZnO thin films for formation of abrupt junctions in p-n device structures. © 2005 Elsevier B.V. All rights reserved.
653 a AFM
653 a PEMOCVD
653 a XRD
653 a ZnO doped by Ga
653 a NATURAL SCIENCES
653 a NATURVETENSKAP
700a Grossner, U.u University of Oslo, Physics Department, Centre for Materials Science and Nanotechnology, N-0316 Oslo, Norway4 aut
700a Nilsen, O.u University of Oslo, Chemistry Department, Centre for Materials Science and Nanotechnology, N-0316 Oslo, Norway4 aut
700a Lazorenko, V.u Institute for Problems of Material Science, Krzhyzhanovskyy str. 3, 03142 Kiev, Ukraine4 aut
700a Lashkarev, G.V.u Institute for Problems of Material Science, Krzhyzhanovskyy str. 3, 03142 Kiev, Ukraine4 aut
700a Svensson, B.G.u University of Oslo, Physics Department, Centre for Materials Science and Nanotechnology, N-0316 Oslo, Norway4 aut
700a Yakimova, Rositsau Linköpings universitet,Halvledarmaterial,Tekniska högskolan4 aut0 (Swepub:liu)rosia15
710a Institute for Problems of Material Science, Krzhyzhanovskyy str. 3, 03142 Kiev, Ukraine, University of Oslo, Physics Department, Centre for Materials Science and Nanotechnology, N-0316 Oslo, Norwayb University of Oslo, Physics Department, Centre for Materials Science and Nanotechnology, N-0316 Oslo, Norway4 org
773t Thin Solid Filmsd : Elsevier BVg 515:2 SPEC. ISS., s. 472-476q 515:2 SPEC. ISS.<472-476x 0040-6090x 1879-2731
8564 8u https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-50103
8564 8u https://doi.org/10.1016/j.tsf.2005.12.269

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