WFRF:(Zhang Bin Bin)
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Morphological instability of NiSi1-uGeu on singel-crystal and polycrystalline Si1-xGex
- Seger, Johan (author)
-
- Jarmar, Tobias (author)
- Uppsala universitet,Institutionen för teknikvetenskaper,Materialvetenskap
- Zhang, Zhi-Bin (author)
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- Radamson, Henry (author)
- Zhang, Shi-Li (author)
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- (creator_code:org_t)
- 2004
- 2004
- Undefined language.
- In: Journal of Applied Physics. ; 96, s. 1919-1928
- Journal article (peer-reviewed)
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- Seger, Johan
- Jarmar, Tobias
- Zhang, Zhi-Bin
- Radamson, Henry
- Ericson, Fredric
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