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Hydrogen passivatio...
Hydrogen passivation of silicon carbide by low-energy ion implantation
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Achtziger, N (author)
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Grillenberger, J (author)
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Witthuhn, W (author)
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- Linnarsson, M K (author)
- KTH,Skolan för informations- och kommunikationsteknik (ICT)
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Janson, M S (author)
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Svensson, B G (author)
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(creator_code:org_t)
- AIP Publishing, 1998
- 1998
- English.
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In: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 73, s. 945-947
- Related links:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
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- implantation of deuterium is performed to investigate the mobility and passivating effect of hydrogen in epitaxial alpha-SiC (polytypes 4H and 6H). To avoid excessive damage and the resulting trapping of hydrogen, the implantation is performed with low energy (600 eV H-2(2)+). The H-2 depth profile is analyzed by secondary ion mass spectrometry. Electrical properties are measured by capacitance-voltage profiling and admittance spectroscopy. In p-type SIG, hydrogen diffuses on a mu m scale even at room temperature and effectively passivates accepters. In n-type SiC, the incorporation of H is suppressed and no passivation is detected. (C) 1998 American Institute of Physics.
Subject headings
- NATURVETENSKAP -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Condensed Matter Physics (hsv//eng)
Publication and Content Type
- ref (subject category)
- art (subject category)
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