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Quantitative APT an...
Quantitative APT analysis of Ti(C,N)
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- Angseryd, Jenny, 1979 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Liu, Fang, 1975 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Andrén, Hans-Olof, 1947 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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Gerstl, Stephan S A (author)
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- Thuvander, Mattias, 1968 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- Elsevier BV, 2011
- 2011
- English.
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In: Ultramicroscopy. - : Elsevier BV. - 1879-2723 .- 0304-3991. ; 111:6, s. 609-614
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Abstract
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- A specially produced Ti(C,N) standard material, with a known nominal composition, was investigated with laser assisted atom probe tomography. The occurrence of molecular ions and single/multiple events was found to be influenced by the laser pulse energy, and especially C related events were affected. Primarily two issues were considered when the composition of Ti(C,N) was determined. The first one is connected to detector efficiency, due to the detector dead-time. The second one is connected to peak overlap in the mass spectrum. A method is proposed for quantification of the C content in order to establish the C/N ratio. A correction was made to the major C peaks, C at 6 and 12 Da, with the 13C isotopes, at 6.5 and 13 Da, according to the known natural abundance. In addition, a correction of the peak at 24 Da, where C and Ti overlap, is proposed based on the occurrence of single/multiple events for respective element. The results were compared to the results from other techniques such as electron energy loss spectroscopy, chemical analysis and X-ray diffraction. After applying the corrections, atom probe tomography results were satisfactory. Furthermore, the content of dissolved O in Ti(C,N) was successfully quantified. © 2011 Elsevier B.V.
Subject headings
- NATURVETENSKAP -- Kemi -- Analytisk kemi (hsv//swe)
- NATURAL SCIENCES -- Chemical Sciences -- Analytical Chemistry (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Materialteknik -- Bearbetnings-, yt- och fogningsteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering -- Manufacturing, Surface and Joining Technology (hsv//eng)
Publication and Content Type
- art (subject category)
- ref (subject category)
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