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(LAR1:liu) pers:(Syväjärvi Mikael)
 

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The influence of substrate morphology on thickness uniformity and unintentional doping of epitaxial graphene on SiC

Eriksson, Jens (author)
Linköpings universitet,Tillämpad Fysik,Tekniska högskolan
Pearce, Ruth (author)
Linköpings universitet,Tillämpad Fysik,Tekniska högskolan
Iakimov, Tihomir (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
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Virojanadara, Chariya (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Gogova, Daniela (author)
Leibniz Institute of Crystal Growth, Berlin, Germany
Andersson, Mike (author)
Linköpings universitet,Tillämpad Fysik,Tekniska högskolan
Syväjärvi, Mikael (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Lloyd Spetz, Anita (author)
Linköpings universitet,Tillämpad Fysik,Tekniska högskolan
Yakimova, Rositza (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
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 (creator_code:org_t)
AIP Publishing, 2012
2012
English.
In: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 100:24, s. 241607-
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • A pivotal issue for the fabrication of electronic devices on epitaxial graphene on SiC is controlling the number of layers and reducing localized thickness inhomogeneities. Of equal importance is to understand what governs the unintentional doping of the graphene from the substrate. The influence of substrate surface topography on these two issues was studied by work function measurements and local surface potential mapping. The carrier concentration and the uniformity of epitaxial graphene samples grown under identical conditions and on substrates of nominally identical orientation were both found to depend strongly on the terrace width of the SiC substrate after growth.

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