Search: (LAR1:liu) pers:(Syväjärvi Mikael)
> (2010-2014) >
The influence of su...
The influence of substrate morphology on thickness uniformity and unintentional doping of epitaxial graphene on SiC
-
- Eriksson, Jens (author)
- Linköpings universitet,Tillämpad Fysik,Tekniska högskolan
-
- Pearce, Ruth (author)
- Linköpings universitet,Tillämpad Fysik,Tekniska högskolan
-
- Iakimov, Tihomir (author)
- Linköpings universitet,Halvledarmaterial,Tekniska högskolan
-
show more...
-
- Virojanadara, Chariya (author)
- Linköpings universitet,Halvledarmaterial,Tekniska högskolan
-
- Gogova, Daniela (author)
- Leibniz Institute of Crystal Growth, Berlin, Germany
-
- Andersson, Mike (author)
- Linköpings universitet,Tillämpad Fysik,Tekniska högskolan
-
- Syväjärvi, Mikael (author)
- Linköpings universitet,Halvledarmaterial,Tekniska högskolan
-
- Lloyd Spetz, Anita (author)
- Linköpings universitet,Tillämpad Fysik,Tekniska högskolan
-
- Yakimova, Rositza (author)
- Linköpings universitet,Halvledarmaterial,Tekniska högskolan
-
show less...
-
(creator_code:org_t)
- AIP Publishing, 2012
- 2012
- English.
-
In: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 100:24, s. 241607-
- Related links:
-
https://liu.diva-por... (primary) (Raw object)
-
show more...
-
http://liu.diva-port...
-
https://urn.kb.se/re...
-
https://doi.org/10.1...
-
show less...
Abstract
Subject headings
Close
- A pivotal issue for the fabrication of electronic devices on epitaxial graphene on SiC is controlling the number of layers and reducing localized thickness inhomogeneities. Of equal importance is to understand what governs the unintentional doping of the graphene from the substrate. The influence of substrate surface topography on these two issues was studied by work function measurements and local surface potential mapping. The carrier concentration and the uniformity of epitaxial graphene samples grown under identical conditions and on substrates of nominally identical orientation were both found to depend strongly on the terrace width of the SiC substrate after growth.
Publication and Content Type
- ref (subject category)
- art (subject category)
Find in a library
To the university's database