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Multi-parameter est...
Multi-parameter estimation of high-Q silicon rich nitride resonators using optical frequency domain reflectometry
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- Bru, Luis A. (författare)
- Universitat Politecnica de Valencia (UPV),Polytechnic University of Valencia (UPV)
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- Ye, Zhichao, 1991 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Pastor, Daniel (författare)
- Universitat Politecnica de Valencia (UPV),Polytechnic University of Valencia (UPV)
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- Muñoz, Pascual (författare)
- Universitat Politecnica de Valencia (UPV),Polytechnic University of Valencia (UPV)
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(creator_code:org_t)
- SPIE, 2018
- 2018
- Engelska.
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Ingår i: Proceedings of SPIE - The International Society for Optical Engineering. - : SPIE. - 0277-786X .- 1996-756X. ; 10535
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https://research.cha... (primary) (free)
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- Many linear and nonlinear optics applications rely on micro-resonators (MRRs) with carefully designed dispersion and coupling rate coefficients. These parameters are however challenging to measure for MRRs based on high-confinement optical waveguides. In this paper, we report on the use of optical frequency domain reflectometry (OFDR) for the measurement of group velocity dispersion (GVD), coupling coefficients and round-Trip loss, in high-Q (Q i ∼ 0.3 × 10 6 ) silicon-rich nitride MRRs. This technique allows for retrieving the GVD coefficients, intrinsic losses and coupling coefficients for each transverse mode in the resonator, thus providing very valuable feed-back information from experiments to the design flow step.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Medicinteknik -- Medicinsk laboratorie- och mätteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Medical Engineering -- Medical Laboratory and Measurements Technologies (hsv//eng)
- NATURVETENSKAP -- Fysik -- Annan fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Other Physics Topics (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Nyckelord
- Integrated photonics
- Time domain response
- OFDR
- Optical metrology
- Interferometry
- Group velocity dispersion
- Frequency comb
- High-Q microring resonator
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- ref (ämneskategori)
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