WFRF:(Janssen Michael)
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Charge trapping at the dielectric of organic transistors visualized in real time and space
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- Mathijssen, Simon G. J. (author)
- Eindhoven University of Technology, Netherlands; Philips Research Labs, Netherlands
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- Kemerink, Martijn (author)
- Eindhoven University of Technology, Netherlands
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- Sharma, Abhinav (author)
- Eindhoven University of Technology, Netherlands
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- (creator_code:org_t)
- Wiley-VCH Verlag, 2008
- 2008
- English.
- In: Advanced Materials. - : Wiley-VCH Verlag. - 0935-9648 .- 1521-4095. ; 20:5, s. 975-
- Journal article (peer-reviewed)
Abstract
Subject headings
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- Scanning Kelvin probe microscopy demonstrates that water-induced charge trapping at the SiO2 dielectric visualized in real time and space - is responsible for the commonly observed gate-bias-induced threshold-voltage shift in organic field-effect transistors. When a bias is applied to the electrodes, charges are injected onto the SiO2 (see background of the figure). When the contacts are grounded, the charges are released again (foreground picture).
Subject headings
- NATURVETENSKAP -- Kemi -- Fysikalisk kemi (hsv//swe)
- NATURAL SCIENCES -- Chemical Sciences -- Physical Chemistry (hsv//eng)
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- art (subject category)
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- Linköping University
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