Sökning: WFRF:(Baranowski M) > (2010-2014) > Contactless Electro...
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000 | 03300naa a2200361 4500 | |
001 | oai:research.chalmers.se:bb3c57c2-9a48-40f7-a0b1-4ff7c5093ddc | |
003 | SwePub | |
008 | 171007s2011 | |||||||||||000 ||eng| | |
024 | 7 | a https://research.chalmers.se/publication/1383882 URI |
024 | 7 | a https://doi.org/10.1088/0268-1242/26/4/0450122 DOI |
040 | a (SwePub)cth | |
041 | a engb eng | |
042 | 9 SwePub | |
072 | 7 | a art2 swepub-publicationtype |
072 | 7 | a ref2 swepub-contenttype |
100 | 1 | a Baranowski, Mu Politechnika Wrocławska,Wrocław University of Science and Technology4 aut |
245 | 1 0 | a Contactless Electroreflectance, Photoluminescence and Time-Resolved Photoluminescence of GaInNAs Quantum Wells Obtained by the MBE Method with N-irradiation |
264 | c 2011-02-25 | |
264 | 1 | b IOP Publishing,c 2011 |
520 | a The optical properties of GaInNAs quantum wells (QW) grown by molecular beam epitaxywith and without N-irradiation (i.e. grown by the classical method) were investigated by thecontactless electroreflectance (CER), temperature-dependent photoluminescence (PL) andtime-resolved PL (TRPL). From CER measurements it was concluded that one type ofnitrogen nearest-neighbor environment (In-rich environment) is dominant for GaInNAs QWsgrown with N-irradiation whereas various nitrogen environments are present for the referenceGaInNAs QW (i.e. the sample obtained by the classical method). PL and TRPL measurementsclearly show that the optical properties of GaInNAs QWs are affected mainly by the amount ofthe incorporated nitride atoms. It was observed that the PL decay time decreased from ∼200to ∼40 ps when the nitrogen concentration is increased from 0.8 to 2.2%. In addition, thepresence of As flux during N-irradiation reduces the amount of the incorporated nitrogen andsimultaneously improves the optical quality of GaInNAs QWs (i.e. it weakens the carrierlocalization at low temperatures and improves the quantum efficiency of PL). | |
650 | 7 | a TEKNIK OCH TEKNOLOGIERx Elektroteknik och elektronik0 (SwePub)2022 hsv//swe |
650 | 7 | a ENGINEERING AND TECHNOLOGYx Electrical Engineering, Electronic Engineering, Information Engineering0 (SwePub)2022 hsv//eng |
700 | 1 | a Kudrawiec, Ru Politechnika Wrocławska,Wrocław University of Science and Technology4 aut |
700 | 1 | a Syperek, Mu Politechnika Wrocławska,Wrocław University of Science and Technology4 aut |
700 | 1 | a Misiewicz, Ju Politechnika Wrocławska,Wrocław University of Science and Technology4 aut |
700 | 1 | a Zhao Ternehäll, Huan,d 1982u Chalmers tekniska högskola,Chalmers University of Technology4 aut0 (Swepub:cth)huanz |
700 | 1 | a Sadeghi, Mahdad,d 1964u Chalmers tekniska högskola,Chalmers University of Technology4 aut0 (Swepub:cth)mahdad |
700 | 1 | a Wang, Shu Min,d 1963u Chalmers tekniska högskola,Chalmers University of Technology4 aut0 (Swepub:cth)shumin |
710 | 2 | a Politechnika Wrocławskab Chalmers tekniska högskola4 org |
773 | 0 | t Semiconductor Science and Technologyd : IOP Publishingg 26:4, s. 045012-q 26:4<045012-x 1361-6641x 0268-1242 |
856 | 4 | u http://dx.doi.org/10.1088/0268-1242/26/4/045012y FULLTEXT |
856 | 4 8 | u https://research.chalmers.se/publication/138388 |
856 | 4 8 | u https://doi.org/10.1088/0268-1242/26/4/045012 |
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