Sökning: L773:1520 8559 OR L773:0734 2101 > Monolayer calibrati...
Fältnamn | Indikatorer | Metadata |
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000 | 03485naa a2200445 4500 | |
001 | oai:DiVA.org:uu-527894 | |
003 | SwePub | |
008 | 240516s2024 | |||||||||||000 ||eng| | |
024 | 7 | a https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-5278942 URI |
024 | 7 | a https://doi.org/10.1116/6.00033022 DOI |
040 | a (SwePub)uu | |
041 | a engb eng | |
042 | 9 SwePub | |
072 | 7 | a ref2 swepub-contenttype |
072 | 7 | a art2 swepub-publicationtype |
100 | 1 | a Lee, Wei Chuangu Univ Zurich, Phys Inst, CH-8057 Zurich, Switzerland.4 aut |
245 | 1 0 | a Monolayer calibration of endofullerenes with x-ray absorption from implanted keV ion doses |
264 | 1 | b American Institute of Physics (AIP),c 2024 |
338 | a print2 rdacarrier | |
520 | a X-ray absorption spectroscopy (XAS) has the highest sensitivity for chemical element detection on surfaces. With this approach, small amounts of lanthanide-containing endofullerene molecules (Ho3N@C80) have been measured by total electron yield at a low flux bending magnet beamline. The monolayer coverage is calibrated by extrapolating the signals of constant doses (3 x 1014 cm-2) of Ho ions implanted into SiO2 with energies between 2 and 115 keV. At room temperature, the Ho XAS spectra of the molecules and implanted ions indicate trivalent but not identical Ho ground states. Still, this approach demonstrates a way for calibration of small coverages of molecules containing open core-shell elements. | |
650 | 7 | a NATURVETENSKAPx Fysikx Den kondenserade materiens fysik0 (SwePub)103042 hsv//swe |
650 | 7 | a NATURAL SCIENCESx Physical Sciencesx Condensed Matter Physics0 (SwePub)103042 hsv//eng |
700 | 1 | a Yu, Lebinu Univ Zurich, Phys Inst, CH-8057 Zurich, Switzerland.4 aut |
700 | 1 | a Oscarsson, Johan,d 1984-u Uppsala universitet,Institutionen för fysik och astronomi4 aut0 (Swepub:uu)johos804 |
700 | 1 | a Ochapski, Michal W.u Ist Italiano Tecnol, Graphene Labs, IT-16163 Genoa, Italy.4 aut |
700 | 1 | a Sagehashi, Ryunosukeu Univ Zurich, Phys Inst, CH-8057 Zurich, Switzerland.4 aut |
700 | 1 | a Zhang, Yangu Leibniz Inst Solid State & Mat Res IFW, D-01069 Dresden, Germany.4 aut |
700 | 1 | a Popov, Alexey A.u Leibniz Inst Solid State & Mat Res IFW, D-01069 Dresden, Germany.4 aut |
700 | 1 | a Gebeyehu, Zewdu M.u Ist Italiano Tecnol, Graphene Labs, IT-16163 Genoa, Italy.4 aut |
700 | 1 | a Martini, Leonardou Ist Italiano Tecnol, Graphene Labs, IT-16163 Genoa, Italy.4 aut |
700 | 1 | a Forti, Stivenu Ist Italiano Tecnol, Graphene Labs, IT-16163 Genoa, Italy.4 aut |
700 | 1 | a Coletti, Camillau Ist Italiano Tecnol, Graphene Labs, IT-16163 Genoa, Italy.4 aut |
700 | 1 | a Delley, Bernardu Paul Scherrer Inst PSI, Swiss Light Source, CH-5232 Villigen, Switzerland.4 aut |
700 | 1 | a Muntwiler, Matthiasu Paul Scherrer Inst PSI, Swiss Light Source, CH-5232 Villigen, Switzerland.4 aut |
700 | 1 | a Primetzhofer, Danielu Uppsala universitet,Institutionen för fysik och astronomi4 aut0 (Swepub:uu)danpr521 |
700 | 1 | a Greber, Thomasu Univ Zurich, Phys Inst, CH-8057 Zurich, Switzerland.4 aut |
710 | 2 | a Univ Zurich, Phys Inst, CH-8057 Zurich, Switzerland.b Institutionen för fysik och astronomi4 org |
773 | 0 | t Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Filmsd : American Institute of Physics (AIP)g 42:2q 42:2x 0734-2101x 1520-8559 |
856 | 4 8 | u https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-527894 |
856 | 4 8 | u https://doi.org/10.1116/6.0003302 |
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