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Sample Preparation ...
Sample Preparation Using Argon Ion Beam Milling
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- Dahlström, Christina, 1977- (författare)
- Mittuniversitetet,Avdelningen för kemiteknik
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(creator_code:org_t)
- Hauppauge, NY : Nova Science Publishers, Inc. 2013
- 2013
- Engelska.
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Ingår i: Argon: Production, Characteristics and Applications. - Hauppauge, NY : Nova Science Publishers, Inc.. - 9781626182042 ; , s. 223-240
- Relaterad länk:
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Abstract
Ämnesord
Stäng
- Surface and cross section analysis can provide important information on material properties. It has, however, been difficult to characterise the internal structure at a micro scale using cross sections prepared with conventional methods, such as e.g. mechanical grinding and polishing, because these procedures can damage the surface and introduce artefacts. A few years ago, a new precision argon ion beam cross section polisher was shown to be a suitable sample preparation technique for microstructure characterisation. It produces high quality cross sections free from artefacts and distortions. This technique can be used for cross section preparation of a wide variety of materials including composites, metals, ceramics and polymers. Argon ion beam milling can also be used in combination with focused ion beam (FIB) as a final step to remove FIB-damaged layers before nano- and microstructure characterisation in high resolution transmission electron microscopy (HRTEM).
Ämnesord
- NATURVETENSKAP -- Kemi (hsv//swe)
- NATURAL SCIENCES -- Chemical Sciences (hsv//eng)
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