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Structure and Conductivity of Epitaxial Thin Films of In-Doped BaZrO3-Based Proton Conductors

Mazzei, Laura, 1988 (författare)
Chalmers, Dept Phys, SE-41296 Gothenburg, Sweden,Chalmers tekniska högskola,Chalmers University of Technology
Wolff, Max (författare)
Uppsala universitet,Materialfysik,Uppsala University
Pergolesi, Daniele (författare)
Paul Scherrer Inst, Energy & Environm Res Div, CH-5232 Villigen, Switzerland.,Paul Scherrer Institut
visa fler...
Dura, Joseph A. (författare)
NIST, Ctr Neutron Res, Gaithersburg, MD 20899 USA.,National Institute of Standards and Technology (NIST)
Börjesson, Lars, 1957 (författare)
Chalmers, Dept Phys, SE-41296 Gothenburg, Sweden.,Chalmers tekniska högskola,Chalmers University of Technology
Gutfreund, Philipp (författare)
Inst Laue Langevin, 71 Ave Martyrs, F-38000 Grenoble, France.,Institut Laue-Langevin
Bettinelli, Marco (författare)
Univ Verona, Luminescent Mat Lab, I-37134 Verona, Italy.,Universita degli Studi di Verona,Verona University
Lippert, Thomas (författare)
Paul Scherrer Inst, Energy & Environm Res Div, CH-5232 Villigen, Switzerland.;ETH, Inorgan Chem Lab, Dept Chem & Appl Biosci, Vladimir Prelog Weg 1-5-10, CH-8093 Zurich, Switzerland.,Eidgenössische Technische Hochschule Zürich (ETH),Swiss Federal Institute of Technology in Zürich (ETH),Paul Scherrer Institut
Karlsson, Maths, 1978 (författare)
Chalmers, Dept Phys, SE-41296 Gothenburg, Sweden.,Chalmers tekniska högskola,Chalmers University of Technology
visa färre...
 (creator_code:org_t)
2016-11-16
2016
Engelska.
Ingår i: The Journal of Physical Chemistry C. - : American Chemical Society (ACS). - 1932-7447 .- 1932-7455. ; 120:50, s. 28415-28422
  • Tidskriftsartikel (refereegranskat)
Abstract Ämnesord
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  • Epitaxial thin films of the proton-conducting perovskite BaZr0.53In0.47O3-delta H0.47-2 delta, grown by pulsed laser deposition, were investigated in their hydrated and dehydrated conditions through a multitechniqu approach with the aim to study the structure and proton concentration depth profile and their relationship to proton conductivity. The techniques used were X-ray diffraction, X-ray and neutron reflectivity, nuclear reaction analysis, and Rutherford backscattering, together with impedance spectroscopy. The obtained proton conductivity and activation energy are comparable to literature values for the bulk conductivity of similar materials, thus showing that grain-boundary conductivity is negligible due to the high crystallinity of the film. The results reveal an uneven proton concentration depth profile, with the presence of a 3-4 nm thick, proton-rich layer with altered composition, likely characterized by cationic deficiency. While this surface layer either retains or reobtains protons after desorption and cooling to room temperature, the bulk of the film absorbs and desorbs protons in the expected mariner. It is suggested that the protons in the near-surface, proton rich region are located in proton sites characterized by relatively strong O-H bonds due to weak hydrogen-bond interactions to neighboring oxygen atoms and that the mobility of protons in these sites is generally lower than in proton sites associated with stronger hydrogen bonds. It follows that strongly hydrogen-bonding configurations are important for high proton mobility.

Ämnesord

TEKNIK OCH TEKNOLOGIER  -- Materialteknik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Materials Engineering (hsv//eng)
NATURVETENSKAP  -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
NATURAL SCIENCES  -- Physical Sciences -- Condensed Matter Physics (hsv//eng)

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