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Profiling structured beams using injected aerosols
- Duane Loh, N. (author)
- Starodub, D. (author)
- Lomb, L. (author)
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- Hampton, C. Y. (author)
- Martin, A. V. (author)
- Sierra, R. G. (author)
- Barty, A. (author)
- Aquila, A. (author)
- Schulz, J. (author)
- Steinbrener, J. (author)
- Shoeman, R. L. (author)
- Kassemeyer, S. (author)
- Bostedt, C. (author)
- Bozek, J. (author)
- Epp, S. W. (author)
- Erk, B. (author)
- Hartmann, R. (author)
- Rolles, D. (author)
- Rudenko, A. (author)
- Rudek, B. (author)
- Foucar, L. (author)
- Kimmel, N. (author)
- Weidenspointner, G. (author)
- Hauser, G. (author)
- Holl, P. (author)
- Pedersoli, E. (author)
- Liang, M. (author)
- Hunter, M. S. (author)
- Gumprecht, L. (author)
- Coppola, N. (author)
- Wunderer, C. (author)
- Graafsma, H. (author)
- Maia, F. R. N. C. (author)
- Ekeberg, T. (author)
- Fleckenstein, H. (author)
- Hirsemann, H. (author)
- Nass, K. (author)
- White, T. A. (author)
- Tobias, H. J. (author)
- Farquar, G. R. (author)
- Henry Benner, W. (author)
- Hau-Riege, S. (author)
- Reich, C. (author)
- Hartmann, A. (author)
- Soltau, H. (author)
- Marchesini, S. (author)
- Bajt, S. (author)
- Barthelmess, M. (author)
- Strueder, L. (author)
- Ullrich, J. (author)
- Bucksbaum, P. (author)
- Hodgson, K. O. (author)
- Frank, M. (author)
- Schlichting, I. (author)
- Chapman, H. N. (author)
- Bogan, M. J. (author)
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- (creator_code:org_t)
- SPIE, 2012
- 2012
- English.
- In: Proceedings of SPIE. - : SPIE. - 9780819492210 ; , s. 850403-
- Conference paper (peer-reviewed)
Abstract
Subject headings
Close
- Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied.
Keyword
- Aerosols
- Beam diagnostics
- Beam profiling
- Diffraction
- Hartmann sensor
- Imaging
- LCLS
- X-ray freeelectron laser
Publication and Content Type
- ref (subject category)
- kon (subject category)
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- By the author/editor
- Duane Loh, N.
- Starodub, D.
- Lomb, L.
- Hampton, C. Y.
- Martin, A. V.
- Sierra, R. G.
- show more...
- Barty, A.
- Aquila, A.
- Schulz, J.
- Steinbrener, J.
- Shoeman, R. L.
- Kassemeyer, S.
- Bostedt, C.
- Bozek, J.
- Epp, S. W.
- Erk, B.
- Hartmann, R.
- Rolles, D.
- Rudenko, A.
- Rudek, B.
- Foucar, L.
- Kimmel, N.
- Weidenspointner, ...
- Hauser, G.
- Holl, P.
- Pedersoli, E.
- Liang, M.
- Hunter, M. S.
- Gumprecht, L.
- Coppola, N.
- Wunderer, C.
- Graafsma, H.
- Maia, F. R. N. C ...
- Ekeberg, T.
- Hantke, Max Feli ...
- Fleckenstein, H.
- Hirsemann, H.
- Nass, K.
- White, T. A.
- Tobias, H. J.
- Farquar, G. R.
- Henry Benner, W.
- Hau-Riege, S.
- Reich, C.
- Hartmann, A.
- Soltau, H.
- Marchesini, S.
- Bajt, S.
- Barthelmess, M.
- Strueder, L.
- Ullrich, J.
- Bucksbaum, P.
- Hodgson, K. O.
- Frank, M.
- Schlichting, I.
- Chapman, H. N.
- Bogan, M. J.
- show less...
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- Uppsala University
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