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Direct observation of large strain through van der Waals gaps on epitaxial B i2 T e3 /graphite : Pseudomorphic relaxation and the role of B i2 layers on the B ix T ey topological insulator series

Rodrigues-Junior, Gilberto (författare)
Federal University of Minas Gerais
Marçal, Lucas Atila Bernardes (författare)
Lund University,Lunds universitet,NanoLund: Centre for Nanoscience,Annan verksamhet, LTH,Lunds Tekniska Högskola,Synkrotronljusfysik,Fysiska institutionen,Institutioner vid LTH,Other operations, LTH,Faculty of Engineering, LTH,Synchrotron Radiation Research,Department of Physics,Departments at LTH,Faculty of Engineering, LTH,Federal University of Minas Gerais
Ribeiro, Guilherme A.S. (författare)
Federal University of Minas Gerais
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Rappl, Paulo Henrique De Oliveira (författare)
Brazilian Institute for Space Research
Abramof, Eduardo (författare)
Brazilian Institute for Space Research
Sciammarella, Paulo Vitor (författare)
Federal University of Viçosa
Guimarães, Luciano De Moura (författare)
Federal University of Viçosa
Pérez, Carlos Alberto (författare)
Brazilian Synchroton Light Laboratory
Malachias, Ângelo (författare)
Federal University of Minas Gerais
visa färre...
 (creator_code:org_t)
2020
2020
Engelska.
Ingår i: Physical Review Materials. - 2475-9953. ; 4:2
  • Tidskriftsartikel (refereegranskat)
Abstract Ämnesord
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  • Layered materials can usually grow without strain on top of distinct substrates if the only interaction between them is due to van der Waals forces. In such a scenario it would be expected that the heterointerface made up of weak bounds would not affect the overlayed material significantly for several large lattice-mismatched systems. Here we have studied the first stages of the heteroepitaxial growth of layered bismuth telluride topological insulator on top of highly oriented pyrolitic graphite (HOPG) by molecular beam epitaxy. Samples were investigated by atomic force microscopy (AFM), synchrotron x-ray diffraction (XRD), and micro-Raman spectroscopy. AFM images show hexagonal/triangular flat islands with exposed HOPG areas for the low coverage regime, and the lattice parameter of these Bi2Te3 structures were measured by XRD. The existence of pseudomorphic strain at the initial Bi2Te3 layers was retrieved by both XRD and Raman spectroscopy. We have found evidence that Bi2Te3 layers near the interface are subject to an in-plane compressive strain, leading to a pseudomorphic out-of-plane lattice expansion. Furthermore, the presence of Bi2Te3 islands locally distorts the topmost layer of HOPG, resulting in tensile strain which was measured by Raman spectroscopy. The observed relaxation of 0.1-0.2% for each van der Waals gap is used to calculate elastic constants of Bi2 bilayers, which are crucial building blocks for the formation of other BixTey topological insulator compounds. Finally, the impact of such a strain in Bi2Te3 electronic structure was investigated by density functional theory calculations. The results show that the band structure of this strained material remains unchanged at the center of the Brillouin zone, confirming the robustness of surface states, but it is consistently affected at the M and K zone edges.

Ämnesord

NATURVETENSKAP  -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
NATURAL SCIENCES  -- Physical Sciences -- Condensed Matter Physics (hsv//eng)

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