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Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry

Darakchieva, Vanya (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Schubert, M (author)
University of Nebraska
Hofmann, T (author)
University of Nebraska
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Monemar, Bo (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Hsiao, Ching-Lien (author)
National Taiwan University
Liu, Ting-Wei (author)
National Taiwan University
Chen, Li-Chyong (author)
National Taiwan University
Schaff, W J (author)
Cornell University
Takagi, Y (author)
Ritsumeikan University
Nanishi, Y (author)
Ritsumeikan University
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 (creator_code:org_t)
AIP Publishing, 2009
2009
English.
In: APPLIED PHYSICS LETTERS. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 95:20, s. 202103-
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • The free electron properties of nonpolar (1120)-oriented and semipolar (1011)-oriented wurtzite InN films are studied by generalized infrared ellipsometry (GIRSE). We demonstrate the sensitivity of GIRSE to the surface charge accumulation layer and find a distinct surface electron accumulation to occur at all surfaces. The obtained surface electron sheet densities are found to vary from 0.9x10(13) to 2.3x10(14) cm(-2) depending on the surface orientation and bulk electron concentration. The upper limits of the surface electron mobility parameters of 417-644 cm(2)/V s are determined and discussed in the light of electron confinement at the surface.

Keyword

accumulation layers
electron density
electron mobility
III-V semiconductors
indium compounds
semiconductor thin films
surface charging
wide band gap semiconductors
NATURAL SCIENCES
NATURVETENSKAP

Publication and Content Type

ref (subject category)
art (subject category)

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