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Domain epitaxial growth of Ta3N5 film on c-plane sapphire substrate

Chang, Jui-Che (author)
Linköpings universitet,Tunnfilmsfysik,Tekniska fakulteten
Birch, Jens, 1960- (author)
Linköpings universitet,Tunnfilmsfysik,Tekniska fakulteten
Kostov Gueorguiev, Gueorgui, 1968- (author)
Linköpings universitet,Tunnfilmsfysik,Tekniska fakulteten
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Bakhit, Babak, 1983- (author)
Linköpings universitet,Tunnfilmsfysik,Tekniska fakulteten
Greczynski, Grzegorz, 1973- (author)
Linköpings universitet,Tunnfilmsfysik,Tekniska fakulteten
Eriksson, Fredrik, 1975- (author)
Linköpings universitet,Tunnfilmsfysik,Tekniska fakulteten
Sandström, Per, 1970- (author)
Linköpings universitet,Tunnfilmsfysik,Tekniska fakulteten
Hultman, Lars, Professor, 1960- (author)
Linköpings universitet,Tunnfilmsfysik,Tekniska fakulteten
Hsiao, Ching-Lien, 1975- (author)
Linköpings universitet,Tunnfilmsfysik,Tekniska fakulteten
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 (creator_code:org_t)
Elsevier, 2022
2022
English.
In: Surface & Coatings Technology. - : Elsevier. - 0257-8972 .- 1879-3347. ; 443
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • Tritantalum pentanitride (Ta3N5) semiconductor is a promising material for photoelectrolysis of water with high efficiency. Ta3N5 is a metastable phase in the complex system of TaN binary compounds. Growing stabilized single-crystal Ta3N5 films is correspondingly challenging. Here, we demonstrate the growth of a nearly single-crystal Ta3N5 film with epitaxial domains on c-plane sapphire substrate, Al2O3(0001), by magnetron sputter epitaxy. Introduction of a small amount ~2% of O2 into the reactive sputtering gas mixed with N2 and Ar facilitates the formation of a Ta3N5 phase in the film dominated by metallic TaN. In addition, we indicate that a single-phase polycrystalline Ta3N5 film can be obtained with the assistance of a Ta2O5 seed layer. With controlling thickness of the seed layer smaller than 10 nm and annealing at 1000 °C, a crystalline β phase Ta2O5 was formed, which promotes the domain epitaxial growth of Ta3N5 films on Al2O3(0001). The mechanism behind the stabilization of the orthorhombic Ta3N5 structure resides in its stacking with the ultrathin seed layer of orthorhombic β-Ta2O5, which is energetically beneficial and reduces the lattice mismatch with the substrate.

Subject headings

NATURVETENSKAP  -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
NATURAL SCIENCES  -- Physical Sciences -- Condensed Matter Physics (hsv//eng)

Keyword

Ta3N5
Sputtering
MSE
XRD
XPS
Water splitting
Single crystal

Publication and Content Type

ref (subject category)
art (subject category)

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