A Parameter Extraction Methodology for Graphene Field-Effect-Transistors

• Graphene field-effect transistors have now been around for more than a decade and their transfer characteristics extensively used for device characterization. Model parameters like low-field charge-carrier mobility and device contact/series resistance have often been the main interest. However, not until recently have the methods for device characterization themselves been the focus of research publications. In this paper, I report on a structured methodology for extracting and validating the extracted GFET model parameter values based on the physics of field-effect transistors in general and of graphene field-effect transistors in particular. During the extraction process the GFET resistance is divided into two parts, a constant part, and a gate-voltage-dependent part where the constant part often has been believed to represent the series/contact resistance. However, part of it depends on the channel length and contains first-order information about mobility degradation. Finally, I show that the main influence of the quantum capa­citance can be captured by an equivalent oxide thickness replacing the insulator thickness.

Ämnesord

NATURVETENSKAP  -- Fysik -- Annan fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences -- Other Physics Topics (hsv//eng)

TEKNIK OCH TEKNOLOGIER  -- Materialteknik -- Annan materialteknik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Materials Engineering -- Other Materials Engineering (hsv//eng)

NATURVETENSKAP  -- Fysik -- Den kondenserade materiens fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences -- Condensed Matter Physics (hsv//eng)

Nyckelord

model parameter extraction

series/contact resistance

mobility degradation.

graphene field-effect transistors

charge-carrier mobility

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