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Heterogeneous 3D integration of 17 μm pitch Si/SiGe quantum well bolometer arrays for infrared imaging systems

Forsberg, Fredrik (author)
KTH,Mikro- och nanosystemteknik,KTH Royal Institute of Technology, Sweden
Fischer, Andreas C., 1982- (author)
KTH,Mikro- och nanosystemteknik,KTH Royal Institute of Technology, Sweden
Roxhed, Niclas (author)
KTH,Mikro- och nanosystemteknik,KTH Royal Institute of Technology, Sweden
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Samel, Björn (author)
RISE,Acreo,Acreo AB
Ericsson, Per (author)
RISE,Acreo,Acreo AB
Stemme, Göran (author)
KTH,Mikro- och nanosystemteknik,KTH Royal Institute of Technology, Sweden
Niklaus, Frank (author)
KTH,Mikro- och nanosystemteknik,KTH Royal Institute of Technology, Sweden
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 (creator_code:org_t)
2013-03-06
2013
English.
In: Journal of Micromechanics and Microengineering. - : IOP Publishing. - 0960-1317 .- 1361-6439. ; 23:4
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • This paper reports on the realization of 17 μm × 17 μm pitch bolometer arrays for uncooled infrared imagers. Microbolometer arrays have been available in primarily defense applications since the mid-1980s and are typically based on deposited thin films on top of CMOS wafers that are surface-machined into sensor pixels. This paper instead focuses on the heterogeneous integration of monocrystalline Si/SiGe quantum-well-based thermistor material in a CMOS-compliant process using adhesive wafer bonding. The high-quality monocrystalline thermistor material opens up for potentially lower noise compared to commercially available uncooled microbolometer arrays together with a competitive temperature coefficient of resistance (TCR). Characterized bolometers had a TCR of -2.9% K-1 in vacuum, measured thermal conductances around 5 × 10-8 W K-1 and thermal time constants between 4.9 and 8.5 ms, depending on the design. Complications in the fabrication of stress-free bolometer legs and low-noise contacts are discussed and analyzed.

Keyword

Adhesive wafer bonding
Heterogeneous integration
Microbolometer arrays
Temperature coefficient of resistance
Thermal conductance
Thermal time constants
Thermistor materials
Uncooled microbolometers
Infrared detectors
Infrared imaging
Semiconductor quantum wells
Temperature sensors
Thermistors
Bolometers

Publication and Content Type

ref (subject category)
art (subject category)

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