New method for determination of the peak-velocity in epitaxial semiconductor structures by dc measurements on microbridges

• A simple current-voltage measurement technique using microbridge patterns is described as a fast method for the determination of the effective peak electron velocity in III-V semiconducting materials. The method is tested for GaAs samples. Microbridge patterns with different geometries were investigated and the influence of ''self-heating'' by power dissipation was examined. Some other potential sources of errors deteriorating the accuracy of measurements were determined.

Subject headings

NATURVETENSKAP  -- Fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences (hsv//eng)

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

NATURVETENSKAP  -- Fysik -- Den kondenserade materiens fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences -- Condensed Matter Physics (hsv//eng)

Publication and Content Type

art (subject category)

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