WFRF:(Tove PA)
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Flying-spot scanning for the separate mapping of resistivity and minority-cariier lifetime in silicon
- Bleichner, H (author)
- Nordlander, E (author)
- Fiedler, G (author)
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- (creator_code:org_t)
- 1986
- 1986
- English.
- In: Solid-State Electronics. - 0038-1101 .- 1879-2405. ; 29:8, s. 779-786
- Journal article (peer-reviewed)
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- Bleichner, H
- Nordlander, E
- Fiedler, G
- Tove, PA
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- Uppsala University
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