Short-time proper orthogonal decomposition of time-resolved schlieren images for transient jet screech characterization

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Fältnamn	Indikatorer	Metadata
000		04113naa a2200433 4500
001		oai:DiVA.org:kth-289064
003		SwePub
008		210127s2020 \| \|\|\|\|\|\|\|\|\|\|\|000 \|\|eng\|
024	7	a https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-2890642 URI
024	7	a https://doi.org/10.1016/j.ast.2020.1062762 DOI
040		a (SwePub)kth
041		a engb eng
042		9 SwePub
072	7	a ref2 swepub-contenttype
072	7	a art2 swepub-publicationtype
100	1	a Lim, H. D.u Nanyang Technol Univ, Sch Mech & Aerosp Engn, 50 Nanyang Ave, Singapore 639798, Singapore.4 aut
245	1 0	a Short-time proper orthogonal decomposition of time-resolved schlieren images for transient jet screech characterization
264	1	b Elsevier BV,c 2020
338		a print2 rdacarrier
500		a QC 20210127
520		a Short-time Proper Orthogonal Decomposition (POD) is proposed as an image-based technique to study the transient jet screech characteristics of moderately under-expanded supersonic jets emanating from a circular baseline and two bevelled nozzles. Time-resolved schlieren imaging of turbulent flow structures were performed with an ultrahigh-speed schlieren setup. Short-time POD was performed by systematically sampling image-series with a short time delay, performing PODs and applying spectral analyses on the first POD mode coefficients, and plotting the peak frequencies from the resulting PSDs into a peak frequency-occurrence count histogram. The results are in good agreement with the near-field noise spectra and wavelet transform analysis of the microphone measurements, which revealed intermittent jet screech occurrences at St=0.25 for both baseline and 30 degrees bevelled jets, while none was detected for the 60 degrees bevelled jet. In particular, the occurrence counts of the frequency bins is proposed as a suitable parameter to characterize the intermittent nature of jet screech, with the frequency bin revealing the jet screech frequency if present. The present study demonstrates the advantage of short-time POD analysis on time-resolved schlieren images over traditional image-based POD methods, which includes computational gains from parallelization, the ability to handle much larger datasets and revealing insights into a transient flow and noise phenomenon.
650	7	a TEKNIK OCH TEKNOLOGIERx Maskinteknikx Strömningsmekanik och akustik0 (SwePub)203062 hsv//swe
650	7	a ENGINEERING AND TECHNOLOGYx Mechanical Engineeringx Fluid Mechanics and Acoustics0 (SwePub)203062 hsv//eng
653		a Flow diagnostics
653		a Schlieren
653		a Aeroacoustics
653		a Jet screech
653		a Supersonic jets
653		a Proper orthogonal decomposition
700	1	a Wei, X. F.u Nanyang Technol Univ, Sch Mech & Aerosp Engn, 50 Nanyang Ave, Singapore 639798, Singapore.4 aut
700	1	a Zang, B.u Nanyang Technol Univ, Sch Mech & Aerosp Engn, 50 Nanyang Ave, Singapore 639798, Singapore.;Univ Bristol, Dept Aerosp Engn, Queens Bldg,Univ Walk, Bristol BS8 1TR, Avon, England.4 aut
700	1	a Vevek, U. S.u Nanyang Technol Univ, Sch Mech & Aerosp Engn, 50 Nanyang Ave, Singapore 639798, Singapore.4 aut
700	1	a Mariani, Raffaello,c Assistant Prof.d 1981-u Nanyang Technol Univ, Sch Mech & Aerosp Engn, 50 Nanyang Ave, Singapore 639798, Singapore4 aut0 (Swepub:kth)u18c6alu
700	1	a New, T. H.u Nanyang Technol Univ, Sch Mech & Aerosp Engn, 50 Nanyang Ave, Singapore 639798, Singapore.4 aut
700	1	a Cui, Y. D.u Natl Univ Singapore, Temasek Labs, 5A Engn Dr 1, Singapore 117411, Singapore.4 aut
710	2	a Nanyang Technol Univ, Sch Mech & Aerosp Engn, 50 Nanyang Ave, Singapore 639798, Singapore.b Nanyang Technol Univ, Sch Mech & Aerosp Engn, 50 Nanyang Ave, Singapore 639798, Singapore.;Univ Bristol, Dept Aerosp Engn, Queens Bldg,Univ Walk, Bristol BS8 1TR, Avon, England.4 org
773	0	t Aerospace Science and Technologyd : Elsevier BVg 107q 107x 1270-9638x 1626-3219
856	4 8	u https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-289064
856	4 8	u https://doi.org/10.1016/j.ast.2020.106276

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Av författaren/redakt...: Lim, H. D.; Wei, X. F.; Zang, B.; Vevek, U. S.; Mariani, Raffael ...; New, T. H.; visa fler...; Cui, Y. D.; visa färre...

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