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Thermal Characterization of Low-Dimensional Materials by Resistance Thermometers

Fu, Yifeng, 1984 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Cui, G (author)
Sun Yat-Sen University
Jeppson, Kjell, 1947 (author)
Chalmers tekniska högskola,Chalmers University of Technology
 (creator_code:org_t)
2019-05-29
2019
English.
In: Materials. - : MDPI AG. - 1996-1944. ; 12:11
  • Research review (peer-reviewed)
Abstract Subject headings
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  • The design, fabrication, and use of a hotspot-producing and temperature-sensing resistance thermometer for evaluating the thermal properties of low-dimensional materials are described in this paper. The materials that are characterized include one-dimensional (1D) carbon nanotubes, and two-dimensional (2D) graphene and boron nitride films. The excellent thermal performance of these materials shows great potential for cooling electronic devices and systems such as in three-dimensional (3D) integrated chip-stacks, power amplifiers, and light-emitting diodes. The thermometers are designed to be serpentine-shaped platinum resistors serving both as hotspots and temperature sensors. By using these thermometers, the thermal performance of the abovementioned emerging low-dimensional materials was evaluated with high accuracy.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Nanoteknik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Nano-technology (hsv//eng)

Keyword

carbon nanotube
graphene
thermal characterization
resistance temperature detector
boron nitride
heat spreader

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Fu, Yifeng, 1984
Cui, G
Jeppson, Kjell, ...
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ENGINEERING AND TECHNOLOGY
ENGINEERING AND ...
and Nano technology
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Materials
By the university
Chalmers University of Technology

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